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Proceedings Paper

Use Of Monte-Carlo Analysis In Estimating Yields Of Acceptable Infrared Detector Array Modules
Author(s): Paul E. Thurlow
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Paper Abstract

Production yield of acceptable focal plane infrared (IR) arrays may be minimal when performance specifications are severe. When anticipated yields are orders of magnitude below unity, the ability to estimate yields, and to identify production factors which can improve yields, assumes a particular importance. Since production yields as a function of focal plane array parameters cannot normally be computed analytically, empirical statistical methods must be developed, based primarily on numerical modeling and simulation, and confirmed by available spot-check measurements. This paper describes one method of estimating array yields, using a monte-carlo approach to model individual and combined photodiode performance in a statistical manner.

Paper Details

Date Published: 19 January 1984
PDF: 5 pages
Proc. SPIE 0430, Infrared Technology IX, (19 January 1984); doi: 10.1117/12.936398
Show Author Affiliations
Paul E. Thurlow, Santa Barbara Research Center (United States)

Published in SPIE Proceedings Vol. 0430:
Infrared Technology IX
Richard A. Mollicone; Irving J. Spiro, Editor(s)

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