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Proceedings Paper

Small Angle Bidirectional Reflectance Distribution Function (BRDF) at 10 µm
Author(s): Wallace K. Wong
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Paper Abstract

The Sensor Systems Group (SSG), Inc., has been routinely using a BRDF measurement as an acceptance test for low scatter mirrors for use in high straylight rejection telescopes. Our conventional 10.6 μm BRDF measurement apparatus can characterize a low scatter sample from -5° to -50° off specular using a sampling ΩFOV of 2.2 X 10-4 sr. Recently, this apparatus was modified to allow successful measurement of a 24-inch focal length low scatter off-axis parabola from 0.5° to 5° off specular using a sampling QFOV of 1.2 X 10-5 sr. The measured BRDF data on this particular sample at 0.5, 1.0, 2.0 and 5.0 degrees are 6.5 X 10-4, 2.1 X 10-4, 6.7 X 10-5 and 1.5 X 10-5 per sr, respectively. The test configuration and design issues are described in this paper.

Paper Details

Date Published: 19 January 1984
PDF: 7 pages
Proc. SPIE 0430, Infrared Technology IX, (19 January 1984); doi: 10.1117/12.936385
Show Author Affiliations
Wallace K. Wong, SSG, Inc. (United States)


Published in SPIE Proceedings Vol. 0430:
Infrared Technology IX
Richard A. Mollicone; Irving J. Spiro, Editor(s)

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