Share Email Print

Proceedings Paper

Small Angle Bidirectional Reflectance Distribution Function (BRDF) at 10 µm
Author(s): Wallace K. Wong
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Sensor Systems Group (SSG), Inc., has been routinely using a BRDF measurement as an acceptance test for low scatter mirrors for use in high straylight rejection telescopes. Our conventional 10.6 μm BRDF measurement apparatus can characterize a low scatter sample from -5° to -50° off specular using a sampling ΩFOV of 2.2 X 10-4 sr. Recently, this apparatus was modified to allow successful measurement of a 24-inch focal length low scatter off-axis parabola from 0.5° to 5° off specular using a sampling QFOV of 1.2 X 10-5 sr. The measured BRDF data on this particular sample at 0.5, 1.0, 2.0 and 5.0 degrees are 6.5 X 10-4, 2.1 X 10-4, 6.7 X 10-5 and 1.5 X 10-5 per sr, respectively. The test configuration and design issues are described in this paper.

Paper Details

Date Published: 19 January 1984
PDF: 7 pages
Proc. SPIE 0430, Infrared Technology IX, (19 January 1984); doi: 10.1117/12.936385
Show Author Affiliations
Wallace K. Wong, SSG, Inc. (United States)

Published in SPIE Proceedings Vol. 0430:
Infrared Technology IX
Richard A. Mollicone; Irving J. Spiro, Editor(s)

© SPIE. Terms of Use
Back to Top