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Proceedings Paper

Projection Interference Fringes Microscope
Author(s): O. D. D. Soares; S. P. Almeida
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Paper Abstract

Surface topography is a topic of relevant interest to science, technology and industry. The method of projected interference fringes is reconsidered in view of applications to non-optical surface microscopic topography. Completion of the analysis of the limitations of the technique is continued in discussing method implementation with computer image processing techniques. Shifting of the fringe pattern by phase modulation to eliminate interpretation ambiguities and the discontinuous observation of the surface is examined for automatization of profile evaluation. Amplitude modulation for pulsed illumination is introduced combined with synchronized video-recording to the metrology of transient events.

Paper Details

Date Published: 15 November 1983
PDF: 7 pages
Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); doi: 10.1117/12.936355
Show Author Affiliations
O. D. D. Soares, Universidade do Porto (Portugal)
S. P. Almeida, Virginia Polytechnic & State University (United States)


Published in SPIE Proceedings Vol. 0429:
Precision Surface Metrology
James C. Wyant, Editor(s)

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