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Proceedings Paper

Advanced Circularly Ruled Gratings for General Surface Metrology
Author(s): Karl M. Bystricky; Teresa A. Fritz
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Paper Abstract

The properties of a circularly ruled grating are discussed for the case in which the rulings are unequally spaced. This type of grating, which combines power and aberration control with conical mapping, is shown to be a key element in the design of the null corrector arm for an interferometer. Examples of test configurations are given for a non-linear axicon, a Wolter type telescope segment, and a fast aspheric.

Paper Details

Date Published: 15 November 1983
PDF: 7 pages
Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); doi: 10.1117/12.936348
Show Author Affiliations
Karl M. Bystricky, Perkin-Elmer Corporation (United States)
Teresa A. Fritz, Perkin-Elmer Corporation (United States)


Published in SPIE Proceedings Vol. 0429:
Precision Surface Metrology
James C. Wyant, Editor(s)

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