Share Email Print
cover

Proceedings Paper

Calculation Of Surface Statistics From Light Scatter
Author(s): John C. Stover; Steven A. Serati; Calvin H. Gillespie
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The operation of a differential scatterometer developed at Montana State University is briefly described. The scatterometer takes and stores data under computer control. Analysis routines allow calculation of the surface power spectral density function (PSD) for the cases of one dimensional surfaces [Z(x) - diamond turned surfaces for example] and isotropic two dimensional surfaces [Z(x,y) - polished surfaces for example]. In addition, the zero and second moments of the PSD may be taken to provide bandwidth limited values of the root mean square roughness [a] and the root mean square slope [m]. Results from several samples are used to check the vector perturbation theory [Church, et. al. 1975] used by the computer to relate the scatter distribution function to the PSD. These experiments take advantage of the fact that the surface - and hence its PSD - remain a constant function during the measurements. Variations in the incident angle and polarization are introduced and the resulting PSD's are calculated and compared. In another experiment, the min/max scatter angles (or conversely the min/max PSD spatial frequencies) are matched to those of a total integrated scatter (TIS) system. Integration over the light scatter data and the PSD allows direct comparison to the TIS and effective rms roughness obtained by the TIS system.

Paper Details

Date Published: 15 November 1983
PDF: 9 pages
Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); doi: 10.1117/12.936345
Show Author Affiliations
John C. Stover, Montana State University (United States)
Steven A. Serati, Montana State University (United States)
Calvin H. Gillespie, Lawrence Livermore National Laboratory (United States)


Published in SPIE Proceedings Vol. 0429:
Precision Surface Metrology
James C. Wyant, Editor(s)

© SPIE. Terms of Use
Back to Top