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Proceedings Paper

Wavefront Evaluation On Laser Diodes Using A Phase Measurement Interferometer
Author(s): Kang M. Leung; Steven R. Lange
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Paper Abstract

To implement a semiconductor laser diode for use in high density optical data storage systems, the output laser beam must be first collimated and then focussed to a near diffraction-limited spot. Therefore, it is essential to know both the beam intensity profile and the phase distribution of the laser wavefront with high precision on the order of one fiftieth of a wavelength. This measurement is important to both the laser diode manufacturers and users. In this paper, we will describe how the wavefront of a laser diode collimator pen was measured by using a state-of-the-art phase measurement interferometer built by WYKO Optical, Inc. Performance of this interferometer is evaluated using both He-Ne and diode lasers.

Paper Details

Date Published: 15 November 1983
PDF: 8 pages
Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); doi: 10.1117/12.936337
Show Author Affiliations
Kang M. Leung, Optical Peripherals Laboratory (United States)
Steven R. Lange, WYKO Optical, Inc. (United States)

Published in SPIE Proceedings Vol. 0429:
Precision Surface Metrology
James C. Wyant, Editor(s)

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