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Proceedings Paper

A Heterodyne Interferometer For Testing Laser Diodes
Author(s): John Hayes; Steve Lange
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Paper Abstract

A heterodyne, Mach-Zehnder interferometer system has been developed for testing the wavefront quality of laser diode collimator pens. The testing system is described and the problems associated with testing laser diodes are discussed.

Paper Details

Date Published: 15 November 1983
PDF: 5 pages
Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); doi: 10.1117/12.936336
Show Author Affiliations
John Hayes, WYKO Optical, Inc. (United States)
University of Arizona (United States)
Steve Lange, WYKO Optical, Inc. (United States)


Published in SPIE Proceedings Vol. 0429:
Precision Surface Metrology
James C. Wyant, Editor(s)

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