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Proceedings Paper

Determination Of Optical Constants From Photometric Measurements
Author(s): T. S. Eriksson; A. Hjortsberg
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Paper Abstract

We discuss and compare several photometric methods for the evaluation of optical constants of thin absorbing films. Optical constants of such films are frequently troublesome to assess with conventional photometric techniques. For the commonly used (T,R) method, where near normal transmittance T and reflectance R of a thin film on a transparent sub-strate are measured, specific problems occur when the real part n of the refractive index is of the same order of magnitude as the imaginary part k. By combining instead T and Rm, where Rm is the reflectance of the film on a metallized part of the substrate, we obtain the (T,Rm) method, which has a greatly increased sensitivity. It is further shown that the (T,Rmb) combination, where Rmb is the substrate side reflectance of the thin film with an optically thick metal overcoating, yields additional advantages. A detailed evaluation of the accuracy obtained for the (T,R), (T,Rm) and (T,Rmb) methods is presented.

Paper Details

Date Published: 1 December 1983
PDF: 7 pages
Proc. SPIE 0428, Optical Materials and Process Technology for Energy Efficiency and Solar Applications, (1 December 1983); doi: 10.1117/12.936312
Show Author Affiliations
T. S. Eriksson, Chalmers University of Technology (Sweden)
A. Hjortsberg, ASEA Research (Sweden)


Published in SPIE Proceedings Vol. 0428:
Optical Materials and Process Technology for Energy Efficiency and Solar Applications
Carl M. Lampert, Editor(s)

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