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Proceedings Paper

Microcomputer Controlled Optical Scanner For Solar Cell Diagnostics
Author(s): V. Dutta; O. S . Sastry; K . L. Chopra
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Paper Abstract

An optical scanner for on-line analysis of defects in solar cells is described. A micro-computer is used to scan a He-Ne laser spot (5 to 25 pm diameter) over the solar cell in both X and Y directions. It also acquires 'Sc or Voc signal at each point in the area scanned and presents a map on an oscilloscope/X-Y recorder. For detailed analysis of a defective region, a fine scan is made and such cell parameters as recombination velocity and diffusion length around the defect region are calculated. The scanner has been used to study the spatial variations in the performance of single crystal and polycrystalline Si solar cells and thin film CdS/Cu2S solar cells.

Paper Details

Date Published: 1 December 1983
PDF: 8 pages
Proc. SPIE 0428, Optical Materials and Process Technology for Energy Efficiency and Solar Applications, (1 December 1983); doi: 10.1117/12.936305
Show Author Affiliations
V. Dutta, Indian Institute of Technology (India)
O. S . Sastry, Indian Institute of Technology (India)
K . L. Chopra, Indian Institute of Technology (India)


Published in SPIE Proceedings Vol. 0428:
Optical Materials and Process Technology for Energy Efficiency and Solar Applications
Carl M. Lampert, Editor(s)

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