Share Email Print
cover

Proceedings Paper

Effect Of Oblique Deposition On Electro-Optical Response Of Electrochromic Devices For Energy Efficient Windows
Author(s): S. A. Agnihotry; S. S. Bawa; A. M. Biradar; C. P. Sharma; Subhas Chandra
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Electrochromic thin film devices are in advanced stage of development for display applications. Another field of interest is the large area energy efficient window shutter systems for control of transmission and reflectivity. The important desired characteristics for such systems include wide operating temperature range and fast speed of electro-optical response. The use of an "aprotic" electrolyte and "oblique" deposition of WO, improve the operational temperature range and the speed of these systems respectively. A systematic study of the response time with the angle of deposition of WO, reveals that there is an optimum angle for which the response time improves by a factor of three as compared to WO, films deposited normally. The difference in the response times of the normally and the obliquely deposited WO, films is attributed to the morphological differences as shown distinctly by the optical and electron microscopic observations. Use of an oxygen free Li+ based electrolyte increases the operational temperature range, electrochemical stability and lifetime of cycling of these systems.

Paper Details

Date Published: 1 December 1983
PDF: 6 pages
Proc. SPIE 0428, Optical Materials and Process Technology for Energy Efficiency and Solar Applications, (1 December 1983); doi: 10.1117/12.936299
Show Author Affiliations
S. A. Agnihotry, National Physical Laboratory (India)
S. S. Bawa, National Physical Laboratory (India)
A. M. Biradar, National Physical Laboratory (India)
C. P. Sharma, National Physical Laboratory (India)
Subhas Chandra, National Physical Laboratory (India)


Published in SPIE Proceedings Vol. 0428:
Optical Materials and Process Technology for Energy Efficiency and Solar Applications
Carl M. Lampert, Editor(s)

© SPIE. Terms of Use
Back to Top