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Proceedings Paper

An Empirical Investigation Of Variability In Contrast-Detail Diagram Measurements
Author(s): Leh-Nien D. Loo; Kunio Doi; Masamitsu Ishida; Charles E. Metz; Heang-Ping Chan; Yoshiharu Higashida; Yoshie Kodera
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Paper Abstract

The contrast-detail (C-D) diagram has been used widely yin the evaluation of imaging systems including screen-film combinations, computed tomography, and digital radiography. Despite its apparent simplicity and efficiency in generating observer performance data, the relationship between this method and the more rigorous ROC or forced-choice procedures is not well understood. With a high-quality image processing/simulation system, we made images by superimposing digitally simulated square patterns on radiographic noise. We then studied the statistical variability in the C-D diagram due to within- and between-reader differences, and the effect of different numbers of image samples. Results indicate that the percent standard deviations due to each of these variations are about 10-20%. We also compared the visibility thresholds measured by the C-D diagram method and by an 18-alternative forced-choice (18AFC) procedure. Although the thresholds defined in these two methods are fundamentally different, we found that the threshold contrasts measured by the two procedures have similar values.

Paper Details

Date Published: 13 December 1983
PDF: 9 pages
Proc. SPIE 0419, Application of Optical Instrumentation in Medicine XI, (13 December 1983); doi: 10.1117/12.936007
Show Author Affiliations
Leh-Nien D. Loo, The University of Chicago (United States)
Kunio Doi, The University of Chicago (United States)
Masamitsu Ishida, The University of Chicago (United States)
Charles E. Metz, The University of Chicago (United States)
Heang-Ping Chan, The University of Chicago (United States)
Yoshiharu Higashida, The University of Chicago (United States)
Yoshie Kodera, The University of Chicago (United States)


Published in SPIE Proceedings Vol. 0419:
Application of Optical Instrumentation in Medicine XI
Gary D. Fullerton, Editor(s)

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