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Proceedings Paper

Low-Background Measurements Of An Infrared Astronomical Focal Plane
Author(s): C. R. McCreight; A. R. Fernquist; R. B. Pittman; R. G. Walker; J. R. Houck
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Paper Abstract

A low-background test chamber for testing infrared astronomical focal-plane arrays has been built and characterized. The spot-scanning chamber simulates the optics and orbital conditions of the Infrared Astronomical Satellite. The performance of the chamber was established through detailed calculations of the infrared flux on the array and through measurements with reference detectors. The chamber met its performance goals, and produced results consistent with measurements from other laboratories.

Paper Details

Date Published: 22 September 1983
PDF: 8 pages
Proc. SPIE 0416, Applications of Optical Metrology: Techniques and Measurements II, (22 September 1983); doi: 10.1117/12.935932
Show Author Affiliations
C. R. McCreight, NASA Ames Research Center (United States)
A. R. Fernquist, NASA Ames Research Center (United States)
R. B. Pittman, NASA Ames Research Center (United States)
R. G. Walker, Jamieson Science and Engineering, Inc. (United States)
J. R. Houck, Cornell University (United States)


Published in SPIE Proceedings Vol. 0416:
Applications of Optical Metrology: Techniques and Measurements II
Jar Jueh Lee, Editor(s)

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