Share Email Print
cover

Proceedings Paper

Optical Metrology Applications In The Testing Of Military Optical Systems
Author(s): Bruce H. Walker
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In recent years there has been a demand for increased accuracy and precision in the calibration and alignment of visual optical systems for military use. This has led to the development of a number of innovative techniques involving the application of basic optical metrology principles to the testing of these systems. This paper will deal with some of the basic instruments used in such tests, their capabilities and limitations, and will describe in some detail the procedures involved. A typical military instrument will be considered, its optical requirements will be outlined and the instrumentation and procedures employed to verify conformance will be discussed. Typical metrology instruments involved include; Microscopes, Collimators, Theodolites, Dioptometers and Dynameters. Performance characteristics evaluated using these tools and procedures include; magnification, field of view, entrance and exit pupil size, resolution and line of sight scan accuracy. While the level of detail to be discussed will be somewhat superficial, the concepts presented should prove useful in solving a variety of similar problems related to the testing of instruments of this general nature.

Paper Details

Date Published: 22 September 1983
PDF: 6 pages
Proc. SPIE 0416, Applications of Optical Metrology: Techniques and Measurements II, (22 September 1983); doi: 10.1117/12.935916
Show Author Affiliations
Bruce H. Walker, Kollmorgen Corporation (United States)


Published in SPIE Proceedings Vol. 0416:
Applications of Optical Metrology: Techniques and Measurements II
Jar Jueh Lee, Editor(s)

© SPIE. Terms of Use
Back to Top