Share Email Print
cover

Proceedings Paper

Optical Characterization Of The Lockheed Sensor Test Facility
Author(s): Wayne Metheny; Tom Pope; Bruce Steakley
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The recent development of a new long-wave infrared (LWIR) sensor test facilityl presented a number of interesting problems during the course of the optical system alignment. This facility, the Lockheed Sensor Test Facility (STF), was designed primarily for calibration and system testing of LWIR sensors in the 5 to 30 pm range. It combines a low background vacuum chamber with a unique wide field-of-view optical system. This paper will discuss the facility and its optical instrumentation with emphasis on assembly, metrology of alignment, optical characterization, tasks complicated by manufacturing oversights, and an aluminum support structure which shrinks over 1 in. when it is cooled 250 K to the cold operating temperature.

Paper Details

Date Published: 22 September 1983
PDF: 8 pages
Proc. SPIE 0416, Applications of Optical Metrology: Techniques and Measurements II, (22 September 1983); doi: 10.1117/12.935914
Show Author Affiliations
Wayne Metheny, Lockheed Missiles & Space Company, Inc. (United States)
Tom Pope, Lockheed Missiles & Space Company, Inc. (United States)
Bruce Steakley, Lockheed Missiles & Space Company, Inc. (United States)


Published in SPIE Proceedings Vol. 0416:
Applications of Optical Metrology: Techniques and Measurements II
Jar Jueh Lee, Editor(s)

© SPIE. Terms of Use
Back to Top