Share Email Print
cover

Proceedings Paper

A High Resolution CCD Multiplexer
Author(s): Larry Shey-Ping Sheu; Narayan Kadekod i; Yohanes Nugroho; Mike Lo; Margaret Mortz; Ali Ibrahim
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper describes a high resolution CCD multiplexer for focal plane imaging systems. The multiplexer incorporates quadrilinear readout registers to achieve two times the resolution of conventional bilinear structure while using the same design rules. Complete parallel charge transfer are ensured by a novel buried channel poly gate isolation scheme. A monolithic silicon photodiode array of 8 Am pitch, 3533 elements was designed with the multi-plexer. Video preprocessing circuits of high speed four to one channel stitching, compensated sample and hold and bad pixel deletion were integrated on chip for improved performance. The modulation transfer functions due to the geometry and the transfer inefficiency are discussed. The theoretically calculated total MTF agrees with the experimental result. At Nyquist frequency of 62.5 c/mm the total MTF is better than 0.6 in the absence of the diffusion MTF degradation. The noise spectrum of the CCD and the output amplifier are presented. The RMS noise of the CCD in dark is approximately 0.35 my over 1 MHz bandwidth. The CCD noise increases with light input attributed primarily to the shot noise. The low noise nature of the multiplexer makes it ideal for the high resolution low light level detection applications.

Paper Details

Date Published: 30 November 1983
PDF: 6 pages
Proc. SPIE 0409, Technical Issues in Infrared Detectors and Arrays, (30 November 1983); doi: 10.1117/12.935746
Show Author Affiliations
Larry Shey-Ping Sheu, Xerox Corporation (United States)
Narayan Kadekod i, Xerox Corporation (United States)
Yohanes Nugroho, Xerox Corporation (United States)
Mike Lo, Xerox Corporation (United States)
Margaret Mortz, Xerox Corporation (United States)
Ali Ibrahim, Xerox Corporation (United States)


Published in SPIE Proceedings Vol. 0409:
Technical Issues in Infrared Detectors and Arrays
Esther Krikorian, Editor(s)

© SPIE. Terms of Use
Back to Top