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Proceedings Paper

The Refractive Index Of Cd[sub]x[/sub]Hg[sub]1-x[/sub]Te
Author(s): B. Jensen; A. Torabi
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Paper Abstract

The refractive index n of the ternary compound CdxHgl-xTe is calculated as a function of frequency and mole fraction x in terms of known experimental parameters. The theoretical result for n is obtained from a quantum mechanical calculation of the dielectric constant of a compound semiconductor, which has been successfully applied to a number of III V and II VI binary and ternary compounds for which experimental data are available. It is given in terms of basic material parameters only, with no adjustable constants. These material parameters consist of band gap energy, effective electron mass and effective heavy hole mass at the band edge, the spin-orbit splitting energy, the lattice constant and the carrier concentration for n-type or p-type materials. If these parameters are known as functions of mole fraction x, the refractive index is completely determined as a function of frequency below the fundamental absorption edge.

Paper Details

Date Published: 30 November 1983
PDF: 6 pages
Proc. SPIE 0409, Technical Issues in Infrared Detectors and Arrays, (30 November 1983); doi: 10.1117/12.935730
Show Author Affiliations
B. Jensen, Boston University (United States)
A. Torabi, Boston University (United States)

Published in SPIE Proceedings Vol. 0409:
Technical Issues in Infrared Detectors and Arrays
Esther Krikorian, Editor(s)

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