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Proceedings Paper

Can You Describe Optical Surface Quality With One Or Two Numbers?
Author(s): Matt Young
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Paper Abstract

This talk discusses two optical surface quality standards, total integrated scatter (T1S) and the scratch and dig standard (MIL-0-13830A). I begin by using Fourier optics to show that the well known expression, It/I(0) = 4 k2a2, which relates scattered power to rms roughness a, is truly valid only for certain classes of surfaces. Vector scattering theory applied to a more general case shows that in fact optics can measure only a bandwidth limited roughness that can be related to scattered power only if the surface statistics are known. For this reason, the standard should perhaps be regarded as a scattered light standard and not as a surface roughness standard. I conclude by describing our use of a novel optical system to develop an objective measurement technique to aid in the manufacture of the artifacts used to implement the scratch standard.

Paper Details

Date Published: 9 December 1983
PDF: 11 pages
Proc. SPIE 0406, Optical Specifications: Components and Systems, (9 December 1983); doi: 10.1117/12.935666
Show Author Affiliations
Matt Young, U.S. National Bureau of Standards (United States)

Published in SPIE Proceedings Vol. 0406:
Optical Specifications: Components and Systems
Robert E. Fischer; Warren J. Smith, Editor(s)

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