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Proceedings Paper

Complex Reflectivity And Refractive Index Profiles From Reflectivity Magnitude Measurements
Author(s): R. B. Goldner; T. F. Quatieri; M. N. Grimbergen
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Paper Abstract

A problem of interest in thin film optics is to nondestructively measure one-dimensional refractive index profiles. We have been investigating the use of measurements of reflectivity magnitude as a function of incidence angle to determine such refractive index profiles. One approach is to use the Gel'fand Levitan algorithm as outlined by Moses and deRidderl. The algorithm requires knowledge of the Fourier transform of the complex reflectivity function. In this paper we present the results of computer testing an iterative technique for generating the complex reflectivity function from its magnitude and from appropriate constraints. The empirical results indicate that the iterative technique is capable of obtaining complex reflectivity estimates that could be within laboratory ins trument"generated uncertainty.

Paper Details

Date Published: 28 November 1983
PDF: 5 pages
Proc. SPIE 0401, Thin Film Technologies I, (28 November 1983); doi: 10.1117/12.935520
Show Author Affiliations
R. B. Goldner, Tufts University (United States)
T. F. Quatieri, M.I.T. Lincoln Laboratory (United States)
M. N. Grimbergen, Honeywell Electro-Optics Division (United States)


Published in SPIE Proceedings Vol. 0401:
Thin Film Technologies I
J. Roland Jacobsson, Editor(s)

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