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Proceedings Paper

Recent Developments In Antireflective - Interference - Layer-Systems
Author(s): Eckart K. Hussmann; Roland Schnabel
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Paper Abstract

Two special methods were developed to produce antireflective - interference - layer-systems. One is the dip coating process - an additive method. The other method is the neutral solution process - a substractive method. The antireflective layers from both processes are well suited for high power laser systems. A method is described to measure a refractive index gradient in thin layers - as for example leached layers.

Paper Details

Date Published: 18 September 1983
PDF: 8 pages
Proc. SPIE 0400, New Optical Materials, (18 September 1983); doi: 10.1117/12.935486
Show Author Affiliations
Eckart K. Hussmann, Schott Glaswerke (Germany)
Roland Schnabel, Schott Glaswerke (Germany)

Published in SPIE Proceedings Vol. 0400:
New Optical Materials
Solomon Musikant; Josette Dupuy, Editor(s)

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