Share Email Print

Proceedings Paper

Real-Time Comparator Using A High Definition Linear Sensor
Author(s): Marc Giordani; Raymond Pidoux
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The paper describes a system achieving the comparison of high definition images (ty-pically 2000 x 2000 pixels) in real-time (i.e. without image storage) in a typical time of 1 second. The image comparator is composed of two devices: the "TRANSLATOR SYSTEM" and the "TEST STATION". The "TRANSLATOR SYSTEM" provides the means to develop a software "REFERENCE IMAGE" during a preliminary "off-line" phasis, using data obtained from CAD systems or from digitized drawings. The "TEST STATION" features the "COMPARATOR SYSTEM" and the "MEASURING HEAD". The first performs the real-time comparison of a "REAL IMAGE" (provided by a high definition linear solid-state sensor) and the corresponding "REFERENCE IMAGE". This unit is controlled by a microprocessor which feeds the hardware "pixel-comparators" with the necessary reference data. Simultaneously, the real image data obtained by scanning the scene are given pixel by pixel to those comparators. The error detection hardware of the "COMPARATOR SYSTEM" is programmable according to the criteria defining the reject conditions (density and/or patterns of erroneous pixels detected) imposed by the user. Registration errors within certain tolerances may occur without hampering the comparison process.

Paper Details

Date Published: 26 October 1983
PDF: 8 pages
Proc. SPIE 0397, Applications of Digital Image Processing V, (26 October 1983); doi: 10.1117/12.935326
Show Author Affiliations
Marc Giordani, Institut de Recherches Robert Bosch S.A. (Switzerland)
Raymond Pidoux, Institutde Recherches Robert Bosch S.A. (Switzerland)

Published in SPIE Proceedings Vol. 0397:
Applications of Digital Image Processing V
Andre J. Oosterlinck; Andrew G. Tescher, Editor(s)

© SPIE. Terms of Use
Back to Top