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Proceedings Paper

A High Speed, High Resolution, Laser Scanner Subsystem; Measurement Techniques
Author(s): Lee M. Burberry
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Paper Abstract

Techniques for testing laser scanning subsystems play an important role in their development. Testing determines how well the design was implemented, indicates whether all pertinent factors were taken into consideration during the design and error analysis, and most importantly, demonstrates system performance. This paper will discuss typical test methods for scanner subsystems designed and fabricated by the Optical Systems Department of Harris Government Communications Systems Division. Specifications for one Harris scanner are given in Table 1, and a method to test each parameter is discussed below.

Paper Details

Date Published: 20 September 1982
PDF: 4 pages
Proc. SPIE 0390, High Speed Read/Write Techniques for Advanced Printing and Data Handling, (20 September 1982); doi: 10.1117/12.935025
Show Author Affiliations
Lee M. Burberry, Harris Corporation (United States)


Published in SPIE Proceedings Vol. 0390:
High Speed Read/Write Techniques for Advanced Printing and Data Handling
Leo Beiser, Editor(s)

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