Share Email Print
cover

Proceedings Paper

Total Reflectance Properties Of Certain Black Coatings (From 0.2 To 20.0 Micrometers)
Author(s): Ronald R. Willey; Ronald W. George; James G. Ohmart; John W. Walvoord
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The total reflectance of certain black coatings which might be used as optical blacks has been measured at near normal incidence in integrating sphere spectrophotometers from 0.2 to 20.0 micrometers. Scanning Electron Microscope (SEM) pictures of some of the surfaces have been made. Some of the surfaces exhibit relatively constant spectral reflectance, but others show extensive spectral selectivity. Surface topography shows wide variations in structure and appears to correlate with reflectance properties. Renewed interest in the emissivity and absorptance of surfaces for thermal radiative transfer in cryogenics, space, solar applications, etc., has brought to bear technologies for measurement which were not practical in the early days of the space program. Two such technologies are SEM and integrating sphere spectrophotometers in the 2.5 to 20.0 micrometer range.

Paper Details

Date Published: 4 October 1983
PDF: 8 pages
Proc. SPIE 0384, Generation, Measurement and Control of Stray Radiation III, (4 October 1983); doi: 10.1117/12.934933
Show Author Affiliations
Ronald R. Willey, Martin Marietta Orlando Aerospace (United States)
Ronald W. George, Martin Marietta Orlando Aerospace (United States)
James G. Ohmart, Martin Marietta Orlando Aerospace (United States)
John W. Walvoord, Martin Marietta Orlando Aerospace (United States)


Published in SPIE Proceedings Vol. 0384:
Generation, Measurement and Control of Stray Radiation III
Robert P. Breault, Editor(s)

© SPIE. Terms of Use
Back to Top