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Proceedings Paper

Real Time Measurement Of Index And Geometry Changes By Parallelism Interferometry
Author(s): J. E . Ludman; C. Warde
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Paper Abstract

Real time measurement will be reported on the time variations of both the refractive index and geometry of transparent samples. The temperatures of the samples were varied while they were in a parallelism interferometer and the two independent sets of fringe patterns were monitored. One pattern gave the geometric variation, while the others gave the optical path profile. Resolution of quarter wave are readily realized.

Paper Details

Date Published: 13 December 1983
PDF: 1 pages
Proc. SPIE 0370, Holographic Data Nondestructive Testing, (13 December 1983); doi: 10.1117/12.934869
Show Author Affiliations
J. E . Ludman, Rome Air Development Center (United States)
C. Warde, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 0370:
Holographic Data Nondestructive Testing
Dalibor Vukicevic, Editor(s)

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