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Proceedings Paper

Thin Film Diagnostics With Surface Coherent Raman Scattering
Author(s): G. I. Stegeman; R. Fortenberry; R. Moshref zadeh; W. M. Hetherington; N. E. Van Wyck; E. W. Koenig
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Paper Abstract

We predict theoretically and verify experimentally that coherent Stokes (and anti-Stokes) Raman scattering is an efficient method for obtaining the Raman spectrum of a film, provided that the incident and scattered fields are guided by the film. Further calculations indicate that by using various combinations of guided wave modes it should be possible to locate impurities in a thin film.

Paper Details

Date Published: 7 November 1983
PDF: 7 pages
Proc. SPIE 0380, Los Alamos Conf on Optics '83, (7 November 1983); doi: 10.1117/12.934768
Show Author Affiliations
G. I. Stegeman, Optical Sciences Center and Arizona Research Laboratories (United States)
R. Fortenberry, Optical Sciences Center and Arizona Research Laboratories (United States)
R. Moshref zadeh, Optical Sciences Center and Arizona Research Laboratories (United States)
W. M. Hetherington, University of Arizona (United States)
N. E. Van Wyck, University of Arizona (United States)
E. W. Koenig, University of Arizona (United States)


Published in SPIE Proceedings Vol. 0380:
Los Alamos Conf on Optics '83
Robert S. McDowell; Susanne C. Stotlar, Editor(s)

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