Share Email Print
cover

Proceedings Paper

Role For Automatic Fringe Analysis In Optical Metrology
Author(s): D. W. Robinson
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The role of automatic fringe analysis in optical metrology is demonstrated by reference to a number of applications. The techniques of analysis range from binary to gray-level processing, for accurate dimensional metrology and accept-reject thresholdings. Applications include speckle interferometry, position location in three axes, holographic non-destructive testing and moire interferometry.

Paper Details

Date Published: 10 August 1983
PDF: 8 pages
Proc. SPIE 0376, Optical Sensing: Techniques, Benefits, Costs, (10 August 1983); doi: 10.1117/12.934720
Show Author Affiliations
D. W. Robinson, National Physical Laboratory (England)


Published in SPIE Proceedings Vol. 0376:
Optical Sensing: Techniques, Benefits, Costs
S. J. Bennett, Editor(s)

© SPIE. Terms of Use
Back to Top