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Proceedings Paper

Role For Automatic Fringe Analysis In Optical Metrology
Author(s): D. W. Robinson
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Paper Abstract

The role of automatic fringe analysis in optical metrology is demonstrated by reference to a number of applications. The techniques of analysis range from binary to gray-level processing, for accurate dimensional metrology and accept-reject thresholdings. Applications include speckle interferometry, position location in three axes, holographic non-destructive testing and moire interferometry.

Paper Details

Date Published: 10 August 1983
PDF: 8 pages
Proc. SPIE 0376, Optical Sensing: Techniques, Benefits, Costs, (10 August 1983); doi: 10.1117/12.934720
Show Author Affiliations
D. W. Robinson, National Physical Laboratory (England)

Published in SPIE Proceedings Vol. 0376:
Optical Sensing: Techniques, Benefits, Costs
S. J. Bennett, Editor(s)

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