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Proceedings Paper

Speckle In Confocal Scanning Optical Microscopes
Author(s): E. R. Mendez
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Paper Abstract

Using a "free" propagation model, we examine the statistical properties of speckle patterns in confocal scanning optical microscopes. Both reflection and transmission geometries are considered. Expressions for the contrast in both in and out of focus planes are derived in terms of the statistical parameters of the rough surfaces and the geometry of the optical system. The results are evaluated numerically and compared to experimental data.

Paper Details

Date Published: 16 June 1983
PDF: 6 pages
Proc. SPIE 0369, Max Born Centenary Conf, (16 June 1983); doi: 10.1117/12.934434
Show Author Affiliations
E. R. Mendez, Imperial College (United Kingdom)


Published in SPIE Proceedings Vol. 0369:
Max Born Centenary Conf
M. John Colles; D. William Swift, Editor(s)

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