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Proceedings Paper

Advances In Optical Metrology Of Complex Objects
Author(s): C. Wykes; R. Jones
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Paper Abstract

It has been shown previously that Electronic Speckle Pattern Interferometry can be used to compare the shape of nominally identical components. Techniques for calibrating the measurements and for converting the fringe data to surface shape information are discussed here and the accuracy of the measurements has been established.

Paper Details

Date Published: 16 June 1983
PDF: 7 pages
Proc. SPIE 0369, Max Born Centenary Conf, (16 June 1983); doi: 10.1117/12.934369
Show Author Affiliations
C. Wykes, Loughborough University of Technology (England)
R. Jones, Loughborough University of Technology (England)


Published in SPIE Proceedings Vol. 0369:
Max Born Centenary Conf
M. John Colles; D. William Swift, Editor(s)

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