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Proceedings Paper

Interference Film Microscopy For Metal Phase Identification
Author(s): K. W. Raine; P. N. Quested
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Paper Abstract

Constituents in metal alloys and rocks may be seen as different colours using interference film microscopy. The thin films which produce the interfeference colours may be deposited either by vacuum evaporation or reactive sputtering . Tne technique is used in a wide range of investigatons which require identification of phases quickly and easily, e.g. in nickel-base superalloys and hard metals. The theory, techniques for optimising the performance and a method of quantifying the results by microspectrophotometry will be discussed and a case study presented.

Paper Details

Date Published: 29 March 1983
PDF: 9 pages
Proc. SPIE 0368, Microscopy: Techniques and Capabilities, (29 March 1983); doi: 10.1117/12.934334
Show Author Affiliations
K. W. Raine, National Physical Laboratory (United Kingdom)
P. N. Quested, National Physical Laboratory (United Kingdom)


Published in SPIE Proceedings Vol. 0368:
Microscopy: Techniques and Capabilities
Lionel R. Baker, Editor(s)

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