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Proceedings Paper

Applications Of High Voltage Electron Microscopy In Materials Science
Author(s): M. J. Goringe
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Paper Abstract

The principal advantages of the high voltage electron microscope, higher resolution, penetrating power, decreased radiation damage and the special effects of critical voltage and displacement damage are outlined. Some application of increased penetration and radiation damage to studies in materials science are then discussed in more detail.

Paper Details

Date Published: 29 March 1983
PDF: 9 pages
Proc. SPIE 0368, Microscopy: Techniques and Capabilities, (29 March 1983); doi: 10.1117/12.934323
Show Author Affiliations
M. J. Goringe, University of Oxford (England)


Published in SPIE Proceedings Vol. 0368:
Microscopy: Techniques and Capabilities
Lionel R. Baker, Editor(s)

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