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Proceedings Paper

Automatic Testing Of Infrared Components
Author(s): M. Gurien; J. Rysanek
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Paper Abstract

This paper discusses the techniques utilized during automated testing of Z-technology modules for mosaic focal planes. The testing includes continuity and isolation resistance measurements on both layers and modules, and functional tests of the Signal Processing Chips as they are wirebonded to the modules. The criteria for layer selection, empirically derived, is presented. Test results are presented and their impact on product development are described.

Paper Details

Date Published: 12 July 1983
PDF: 7 pages
Proc. SPIE 0366, Modern Utilization of infrared Technology VIII, (12 July 1983); doi: 10.1117/12.934229
Show Author Affiliations
M. Gurien, Grumman Aerospace Corporation (United States)
J. Rysanek, Grumman Aerospace Corporation (United States)


Published in SPIE Proceedings Vol. 0366:
Modern Utilization of infrared Technology VIII
Irving J. Spiro, Editor(s)

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