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Proceedings Paper

Diffraction Limited Focusing Grating For High Energy Laser Diagnostics
Author(s): Francois M. Mottier
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Paper Abstract

A focusing sampling grating can be synthesized by combining a linear grating with a computer plotted zone plate. Phase front distortion figures below λ/20 can be achieved for sampler geometries calling for any diffraction angle and f-numbers down to one. The technique can be generalized for curved substrates.

Paper Details

Date Published: 23 August 1983
PDF: 9 pages
Proc. SPIE 0365, Adaptive Optics Systems and Technology, (23 August 1983); doi: 10.1117/12.934209
Show Author Affiliations
Francois M. Mottier, United Technologies Research Center (United States)


Published in SPIE Proceedings Vol. 0365:
Adaptive Optics Systems and Technology
Richard J. Becherer; Bruce A. Horwitz, Editor(s)

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