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Proceedings Paper

Objective Measurement And Characterization Of Scratch Standards
Author(s): Matt Young
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Paper Abstract

The manufacture of scratch standards for use with MIL-0-13830A has been hampered by the lack of an objective measurement technique. The U.S. National Bureau of Standards has therefore undertaken a comprehensive program to provide quantitative measurements of the light scattered by the scratches and to correlate them with assessments made by trained observers. In this paper, I apply scalar diffraction theory to developing design criteria for a polar scanning apparatus, describe an apparatus that includes a novel optical system, and show scans from one full set of secondary standards. Comparing these scans with the visual assessments is not straightforward.

Paper Details

Date Published: 5 April 1983
PDF: 7 pages
Proc. SPIE 0362, Scattering in Optical Materials II, (5 April 1983); doi: 10.1117/12.934137
Show Author Affiliations
Matt Young, National Bureau of Standards (U.S.) (United States)


Published in SPIE Proceedings Vol. 0362:
Scattering in Optical Materials II
Solomon Musikant, Editor(s)

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