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Proceedings Paper

Optical Surface Analysis Code (OSAC)
Author(s): R. J. Noll; P. E. Glenn; J. Osantowski
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Paper Abstract

A computer program for the evaluation of surface ripple effects on an optical system is discussed. The program consists of a modification of conventional ray tracing so that the effects of all roughness frequency scales on image quality can be analyzed. The code is designed to deal with image quality problems arising in connection with x-ray telescopes and near normal incidence systems used in the infrared, visible, and near UV parts of the spectrum. The emphasis of the program analysis is on narrow-angle scattering and its effect on image quality. The intent is to provide the optical engineer with a measure of the sensitivity of image quality to various surface characteristics. The paper will highlight some of the unique modeling features of the code and illustrate some system examples.

Paper Details

Date Published: 5 April 1983
PDF: 8 pages
Proc. SPIE 0362, Scattering in Optical Materials II, (5 April 1983); doi: 10.1117/12.934136
Show Author Affiliations
R. J. Noll, The Perkin-Elmer Corporation (United States)
P. E. Glenn, The Perkin-Elmer Corporation (United States)
J. Osantowski, National Aeronautics and Space Administration (United States)


Published in SPIE Proceedings Vol. 0362:
Scattering in Optical Materials II
Solomon Musikant, Editor(s)

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