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Proceedings Paper

Automated Data Reduction For Speckle Metrology
Author(s): Gene E. Maddux
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Paper Abstract

Speckle Metrology has transitioned from a laboratory curiosity to a useful engineering tool. It is now in a stage where some means is required to process the enormous amount of data it is capable of generating. This paper explores the requirements and characteristics for an automated data reduction system. Examples are given of current operational systems and what direction future system developments may take.

Paper Details

Date Published: 7 July 1983
PDF: 5 pages
Proc. SPIE 0353, Industrial and Commercial Applications of Holography, (7 July 1983); doi: 10.1117/12.933944
Show Author Affiliations
Gene E. Maddux, Air Force Wright Aeronautical Laboratories (United States)


Published in SPIE Proceedings Vol. 0353:
Industrial and Commercial Applications of Holography
Milton Chang, Editor(s)

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