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Proceedings Paper

A Need And Method For Nonuniformity Correction In Solid State Image Sensor
Author(s): Satoru C. Tanaka
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Paper Abstract

When the solid state image devices were introduced into the optical industry, they revolutionized the techniques for image detection, but not without the user tolerating its nonuniformity. This nonuniformity anomaly is usually ignored in many optical imaging applications; accordingly, its existence and effects are known only by a few among the device implementors. In some applications, this anomaly may seriously impair a system design; consequently, the unwary should be informed of its existence. The nonuniformity can be induced electrically and/or optically into a video signal's transmission path, and in turn it produces an arbitrary gray scale on an image space, derived from a uniformly exposed target. This paper defines the nonuniformity in relation to the solid state imaging devices, demonstrates the need to compensate it in low-contrast image application, and discusses an inexpensive network to perform the compensation and the results of its implementation.

Paper Details

Date Published: 10 August 1983
PDF: 8 pages
Proc. SPIE 0350, Focal Plane Methodologies III, (10 August 1983); doi: 10.1117/12.933898
Show Author Affiliations
Satoru C. Tanaka, EG&G Reticon Corporation (United States)


Published in SPIE Proceedings Vol. 0350:
Focal Plane Methodologies III
William S. Chan; John T. Hall, Editor(s)

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