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Proceedings Paper

Morphology And Correlation With Defects Of Small Scale Laser-Induced Damage
Author(s): T. A. Wiggins
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Paper Abstract

A method for compact storage of the appearance of films and surfaces is presented which allows comparisons prior to and following coating and laser damage testing. Observation of substrates coated with ZnS and ThF4 films indicates that for silica substrates the predominate failure mode is cracking and delamination, while for silicon substrates, burns, cracks, and bubble-formation is found. Scratches and dust appear to act as initiators of damage. For the coated silicon substrates, over 90% of the small-scale damage sites were found to have an observable defect (>5 μm) prior to damage testing. Elimination of scratches, voids, dust, film stress, and film defects would substantially increase the damage threshold for large spot cw-radiation applications. There also appears to be 1 μm or small sized defects which would then determine the damage threshold.

Paper Details

Date Published: 15 September 1982
PDF: 9 pages
Proc. SPIE 0346, Thin Film Technologies and Special Applications, (15 September 1982); doi: 10.1117/12.933791
Show Author Affiliations
T. A. Wiggins, The Pennsylvania State University (United States)

Published in SPIE Proceedings Vol. 0346:
Thin Film Technologies and Special Applications
William R. Hunter, Editor(s)

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