Share Email Print

Proceedings Paper

Measurement Of Optical Modulation Functions In Sparsely Sampled Mosaic Focal Plane Arrays
Author(s): J. B. Young; P. E. Thurlow
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

When individual detectors in scanned focal plane arrays are sampled at a rate of once per instantaneous field of view (IFOV), a problem arises in measuring detector optical modulation functions, (SWR, MTF). Ideally, one would like to pass a slit illumination or knife edge illumination across an IFOV, generating respectively, a line spread function or knife edge response curve from which optical modulation could be calculated versus spatial frequency. Use of sampling phase delays is a possible solution, but is subject to phase errors resulting from scan rate variations. The method described here is a "phased knife edge" approach. It employs a multi-bar reticle image, designed so that successive bar edges are slightly shifted in phase with respect to an IFOV area as the IFOV signal is sampled during a single scan. The resulting data, after conversion to a knife edge response function, is convolved with a sliding phase, computer-generated square wave image to find SWR versus spatial frequency. MTF is obtained by converting the knife edge response to a line spread function and applying standard algorithms for convolution of the LSF with sinusoidal bar patterns of desired spatial frequency.

Paper Details

Date Published: 23 November 1982
PDF: 4 pages
Proc. SPIE 0345, Advanced Multispectral Remote Sensing Technology and Applications, (23 November 1982); doi: 10.1117/12.933774
Show Author Affiliations
J. B. Young, Santa Barbara Research Center (United States)
P. E. Thurlow, Santa Barbara Research Center (United States)

Published in SPIE Proceedings Vol. 0345:
Advanced Multispectral Remote Sensing Technology and Applications
Ken J. Ando, Editor(s)

© SPIE. Terms of Use
Back to Top