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Proceedings Paper

Automatic Testing Of Infrared Detector Arrays
Author(s): David A. Jones
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Paper Abstract

Large scale infrared (IR) detector array production requires highly automated and accurate test equipment with data logging features. At Texas Instruments (TI), five different types of automatic test systems have been developed with a central computer data logging system. Two of these system types test the completed array in various stages of integration into the final assembly. These tests include responsivity, detectivity, and other characteristics. Since direct calibration for responsivity and detectivity is not available, close attention to the applicable formulas, an error budget, and calibration procedures is required. This paper first summarizes the many types of tests and test equipment that are used at TI in constructing a finished "Common Module" detector from raw mercury cadium telluride (MCT), then describes in more detail the test sets for automated testing of the array itself, and the factors affecting array test accuracy and calibration.

Paper Details

Date Published: 28 December 1982
PDF: 10 pages
Proc. SPIE 0344, Infrared Sensor Technology, (28 December 1982); doi: 10.1117/12.933746
Show Author Affiliations
David A. Jones, Texas Instruments (United States)


Published in SPIE Proceedings Vol. 0344:
Infrared Sensor Technology
Reinhard D. Ennulat, Editor(s)

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