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Proceedings Paper

Pencil Beam Interferometer For Aspherical Optical Surfaces
Author(s): K. von Bieren
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Paper Abstract

An interferometer which provides for the precise figure measurement of optical surfaces through the interference of two pencil beams, reflected off the optical surface. Since reference surfaces are not required, the interferometer is also capable of analysing aspheric optical surfaces like axicons. The accuracy of the figure measurement is ± 2 nm.

Paper Details

Date Published: 19 November 1982
PDF: 8 pages
Proc. SPIE 0343, Laser Diagnostics, (19 November 1982); doi: 10.1117/12.933743
Show Author Affiliations
K. von Bieren, Rockwell International/Rocketdyne Division (United States)


Published in SPIE Proceedings Vol. 0343:
Laser Diagnostics
Sandor Holly, Editor(s)

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