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Proceedings Paper

Pattern Recognition For Automatic Visual Inspection
Author(s): K. S. Fu
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Paper Abstract

Three major approaches to pattern recognition, (1) template matching, (2) decision-theoretic approach, and (3) structural and syntactic approach, are briefly introduced. The application of these approaches to automatic visual inspection of manufactured products are then reviewed. A more general method for automatic visual inspection of IC chips is then proposed. Several practical examples are included for illustration.

Paper Details

Date Published: 22 November 1982
PDF: 8 pages
Proc. SPIE 0336, Robot Vision, (22 November 1982); doi: 10.1117/12.933606
Show Author Affiliations
K. S. Fu, Purdue University (United States)


Published in SPIE Proceedings Vol. 0336:
Robot Vision
Azriel Rosenfeld, Editor(s)

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