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Proceedings Paper

Progress In Absolute Distance Interferometry
Author(s): C. W. Gillard; N. E. Buholz
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Paper Abstract

This paper describes the results of recent research undertaken to examine the feasibility of employing laser interferametry to precisely measure absolute distance over extended ranges. Results are presented which show a resolution of 0.03 μm (RMS) for measurements over distances up to 10 meters. The technology developed for achieving these results is based on two-color, synthetic Michelson interferometry employing a new CO2 laser source. Indeed, the new laser is the key element in this process: it was specifically designed to sequentially switch between four sets of stable R- and P-line pairs and thereby provide a basis for forming simultaneous equations which were employed to greatly reduce the half wavelength ambiguity typical of single wavelength interferometers. Potential applications to future optical telescopes - particularly the large, multipanel telescopes under consideration for 10-15 years hence - their initial alignment and control, are suggested.

Paper Details

Date Published: 4 November 1982
PDF: 9 pages
Proc. SPIE 0332, Advanced Technology Optical Telescopes I, (4 November 1982); doi: 10.1117/12.933541
Show Author Affiliations
C. W. Gillard, Lockheed Missiles and Space Company (United States)
N. E. Buholz, Lockheed Missiles and Space Company (United States)


Published in SPIE Proceedings Vol. 0332:
Advanced Technology Optical Telescopes I
Lawrence D. Barr; Geoffrey Burbidge, Editor(s)

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