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Proceedings Paper

Static Tests Of TbFe Films For Magneto-Optical Recordings
Author(s): David Cheng; David Treves; Tu Chen
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Paper Abstract

A number of TbFe thin films on 2"x2" glass slides were evaluated as candidates for an erasable memory. Maximum bit density is better then 1μm center to center, limited by the resolving power of the optics. The homogeneity of the films is very good, at least on a microscopic level. The required incident power in 25 ns pulses for writing a 50% bit is in several cases below 5 mW. A variation of a factor of 2 in write power can be tolerated without an appreciable loss in either resolution or error rate. An externally applied biasing field, H, equal to one quarter of the value of coercivity, Hc, is adequate both for writing and for erasing a bit. As fields of the order of 0.6 Hc did not affect the signal, it appears that the tolerance of the system to variations in H is high. From the limited number of samples that have been measured, one can only make educated guesses about optimum values of these parameters. It seems that the maximum in performance lies somewhere in the 100-1000 A and 800-3500 Oe range. However the maximum is very broad, so that probably anything in this range should be adequate.

Paper Details

Date Published: 27 May 1982
PDF: 5 pages
Proc. SPIE 0329, Optical Disk Technology, (27 May 1982); doi: 10.1117/12.933398
Show Author Affiliations
David Cheng, Xerox Palo Alto Research Center (United States)
David Treves, Xerox Palo Alto Research Center (United States)
Tu Chen, Xerox Palo Alto Research Center (United States)

Published in SPIE Proceedings Vol. 0329:
Optical Disk Technology
Robert A. Sprague, Editor(s)

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