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Proceedings Paper

Spatially Uniform Detector Assemblies
Author(s): Erik Anthon
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Paper Abstract

The difficulties in making precision high reflection measurements of thin film optical coatings is described. The need for detector assemblies with very uniform response over a given area is explained. Examples of detector assemblies using shaped diffusor elements are given.

Paper Details

Date Published: 29 April 1982
PDF: 5 pages
Proc. SPIE 0325, Optical Thin Films, (29 April 1982); doi: 10.1117/12.933302
Show Author Affiliations
Erik Anthon, Optical Coating Laboratory, Inc. (United States)


Published in SPIE Proceedings Vol. 0325:
Optical Thin Films
Richard Ian Seddon, Editor(s)

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