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Proceedings Paper

Single Event Testing For Very Large Scale Integrated (VLSI) Circuits In Space Applications
Author(s): Charles S. Guenzer
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Paper Abstract

Advanced integrated circuits when exposed to a space environment are prone to single event radiation effects. Accelerators can provide particle beams which test electrical components in a simulation of the space environments. Methods are available in most cases to relate the accelerator results to predicted performance in space.

Paper Details

Date Published: 4 August 1982
PDF: 7 pages
Proc. SPIE 0319, Very High Speed Integrated Circuit Technology for Electro-Optic Applications, (4 August 1982); doi: 10.1117/12.933162
Show Author Affiliations
Charles S. Guenzer, Naval Research Laboratory (United States)


Published in SPIE Proceedings Vol. 0319:
Very High Speed Integrated Circuit Technology for Electro-Optic Applications
William S. Chan; John T. Hall, Editor(s)

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