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Proceedings Paper

X-Ray Scattering Of Superpolished Flat Mirror Samples
Author(s): B. Aschenbach; H. Brauninger; A. Ondrusch; P. Predehl
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Paper Abstract

X-ray scattering measurements of flat mirror samples taken with moderate (0.5 arcmin) and high (2.5 arc sec) angular resolution are reported. The measurements cover scatter angles ranging from a few arc seconds to ≈ 1 degree. By using standard scattering theories micro-roughness values are derived and spatial wavelength distributions inherent to the mirror surface are discussed.

Paper Details

Date Published: 24 March 1982
PDF: 9 pages
Proc. SPIE 0316, High Resolution Soft X-Ray Optics, (24 March 1982); doi: 10.1117/12.933153
Show Author Affiliations
B. Aschenbach, Max-Planck-Institut fur Physik and Astrophysik (Germany)
H. Brauninger, Max-Planck-Institut fur Physik and Astrophysik (Germany)
A. Ondrusch, Max-Planck-Institut fur Physik and Astrophysik (Germany)
P. Predehl, Max-Planck-Institut fur Physik and Astrophysik (Germany)


Published in SPIE Proceedings Vol. 0316:
High Resolution Soft X-Ray Optics
Eberhard Adolf Spiller, Editor(s)

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