Share Email Print

Proceedings Paper

Reflectivity And Resolution Measurements Of Metallic Multilayers, Beryl, And Potassium Acid Phthalate (KAP) With Synchrotron Radiation In The 1 keV Region
Author(s): M. Berland; A. Burek; P. Dhez; J. M. Esteva; B. Gauthe; R. C. Karnatak; R. E. LaVilla
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A recently constructed reflectometer at LURE used with monochromatized intense synchrotron radiation offers new possibilities for absolute measurements of reflectivity and resolution for metallic multilayers, and natural and synthetic crystals in a wide range of wavelengths. Contrary to the procedure generally used for the reflectivity measurements, in the present arrangement the crystal or multilayer is set at a fixed angle θo corresponding to a desired energy Eo and the energy of the highly polarized incident photon beam is varied around this value by means of a double crystal monochromator. The reflectivity versus energy for a given polarization are obtained directly for the sample crystal. In this communication we give the first examples for the absolute reflectivity and resolution measurements around 1 keV of metallic multilayers, beryl and KAP thus illustrating the potential application of this method.

Paper Details

Date Published: 24 March 1982
PDF: 5 pages
Proc. SPIE 0316, High Resolution Soft X-Ray Optics, (24 March 1982); doi: 10.1117/12.933151
Show Author Affiliations
M. Berland, Universite Paris Sud (France)
A. Burek, National Bureau of Standards (United States)
P. Dhez, Universite Paris Sud (France)
J. M. Esteva, Universite Paris Sud (France)
B. Gauthe, Universite Paris Sud (France)
R. C. Karnatak, Universite Pierre et Marie Curie (France)
R. E. LaVilla, National Bureau of Standards (United States)

Published in SPIE Proceedings Vol. 0316:
High Resolution Soft X-Ray Optics
Eberhard Adolf Spiller, Editor(s)

© SPIE. Terms of Use
Back to Top