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Proceedings Paper

X-Ray And Extreme Ultraviolet Imaging Using Layered Synthetic Microstructures
Author(s): James H. Underwood; Troy W. Barbee; David L. Shealy
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Paper Abstract

Techniques have recently been developed for the fabrication, by sputtering, of multi-layer structures in which the individual layers may have thicknesses as little as a few atomic diameters. Diffraction experiments with x-rays of wavelength ranging from less than 1 Å to 113 Å have shown these layered synthetic microstructures to have a high degree of perfection. They act as efficient reflectors for x-rays and EUV radiation at angles of incidence from 0o to almost 90o (extreme glancing incidence). Experimental results using normal incidence imaging optics at soft x-ray wavelengths are shown. Such optics can be used in a variety of configurations for both solar and non-solar x-ray astronomy. The advantages of two particular systems - the single mirror and the hybrid Wolter-LSM system - are discussed and performance calculations presented.

Paper Details

Date Published: 24 March 1982
PDF: 11 pages
Proc. SPIE 0316, High Resolution Soft X-Ray Optics, (24 March 1982); doi: 10.1117/12.933135
Show Author Affiliations
James H. Underwood, California Institute of Technology (United States)
Troy W. Barbee, Stanford University (United States)
David L. Shealy, University of Alabama in Birmingham (United States)

Published in SPIE Proceedings Vol. 0316:
High Resolution Soft X-Ray Optics
Eberhard Adolf Spiller, Editor(s)

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