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Proceedings Paper

Optical Constants In The Extreme Ultraviolet And Soft X-Ray Region
Author(s): J. C. Rife; J. F. Osantowski
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Paper Abstract

The nature of optical constants and their measurement by reflection or absorption techniques in the extreme ultraviolet and soft x-ray spectral region from 30 to 3000eV is discussed with emphasis on mirror design. Sources of optical constant data are mentioned and reflectance measurements for SiC and Kanigen between 40 and 200 eV are reported.

Paper Details

Date Published: 3 May 1982
PDF: 7 pages
Proc. SPIE 0315, Reflecting Optics for Synchrotron Radiation, (3 May 1982); doi: 10.1117/12.932995
Show Author Affiliations
J. C. Rife, Naval Research Laboratory (United States)
J. F. Osantowski, Goddard Space Flight Center (United States)

Published in SPIE Proceedings Vol. 0315:
Reflecting Optics for Synchrotron Radiation
Malcolm R. Howells, Editor(s)

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