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Proceedings Paper

Effects Of Tilt Of A Four-Bar Pattern On The Minimum Resolvable Temperature Difference (MRTD)
Author(s): T. Saheki; J. Yamashita; T. Takei; M. Kondo
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Paper Abstract

Effects of tilt of a four-bar pattern on the minimum resolvable temperature difference (MRTD) of FLIR are discussed. When the bar pattern is tilted from the direction perpendicular to the detector scan direction, the displayed image of the bars has zigzag edges and the effective overscan ratio for the displayed image of the tilted bar pattern is reduced; both of these effects degrade the perceived signal-to-noise ratio. The quantitative treatments of these effects are presented. The perceived signal-to-noise ratio and the MRTD are de-rived as a function of the tilted angle of the bar pattern. To verify the theoretical results, MRTD measurements were performed with a serial scan FLIR which was developed in our laboratory. The overscan ratio of the FLIR was varied from 1 to 2 while the tilted angle of the bar pattern was changed up to 60°. Good agreement between the theoretical MRTD and the observed one was demonstrated.

Paper Details

Date Published: 28 December 1981
PDF: 9 pages
Proc. SPIE 0310, Image Quality, (28 December 1981); doi: 10.1117/12.932857
Show Author Affiliations
T. Saheki, Mitsubishi Electric Corporation (Japan)
J. Yamashita, Mitsubishi Electric Corporation (Japan)
T. Takei, Mitsubishi Electric Corporation (Japan)
M. Kondo, Mitsubishi Electric Corporation (Japan)

Published in SPIE Proceedings Vol. 0310:
Image Quality
Patrick S. Cheatham, Editor(s)

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