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Proceedings Paper

Noise Effects For Edge Operators
Author(s): R. E. Nasburg; Marion Lineberry
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Paper Abstract

Techniques and analyses for improving the signal-to-noise performance of edge detectors are presented. A general edge detection method is developed as a result of the noise analysis, and a wide class of edge detectors is shown to be insensitive to edge orientation. For this class, an optimal design with respect to noise statistics is found and a comparison made between many common edge operators. Edge and noise models characteristic of typical images are presented and used in the analysis of these edge detectors.

Paper Details

Date Published: 7 December 1981
PDF: 11 pages
Proc. SPIE 0292, Processing of Images and Data from Optical Sensors, (7 December 1981); doi: 10.1117/12.932842
Show Author Affiliations
R. E. Nasburg, Texas Instruments Incorporated (United States)
Marion Lineberry, Texas Instruments Incorporated (United States)

Published in SPIE Proceedings Vol. 0292:
Processing of Images and Data from Optical Sensors
William H. Carter, Editor(s)

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